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Review of Scientific Instruments : Imaging piezospectroscopy

By John B. Abbiss and Bauke Heeg

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Book Id: WPLBN0002169675
Format Type: PDF eBook :
File Size: Serial Publication
Reproduction Date: 4 December 2008

Title: Review of Scientific Instruments : Imaging piezospectroscopy  
Author: John B. Abbiss and Bauke Heeg
Volume: Issue : December 2008
Language: English
Subject: Science, Physics, Natural Science
Collections: Periodicals: Journal and Magazine Collection (Contemporary), Review of Scientific Instruments Collection
Publication Date:
Publisher: American Institute of Physics


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Abbiss And Bauke Heeg, J. B. (n.d.). Review of Scientific Instruments : Imaging piezospectroscopy. Retrieved from

Description: A novel instrument is described for obtaining accurate high-resolution residual stress images of aluminum oxide materials, based on the piezospectroscopy of Cr3+ dopant ions. The instrument employs a charge coupled device camera, a narrow bandpass tunable filter and the use of Tikhonov regularization for reconstruction of the raw spectral data. The experimental accuracy and spectral shift resolution of this method were analyzed with two calibration light sources and with independently measured spectra, and were found to be approximately ±0.01 nm across the pixel array. This is close to the theoretically obtainable accuracy for the particular filter used, a solid etalon Fabry–Pérot filter with a passband of 0.25 nm, based on an analysis with simulated data. The spectral resolution corresponds to a stress resolution, under biaxial stress conditions, of ±40 MPa.


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